The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 31, 2010

Filed:

May. 23, 2008
Applicants:

Paul Michael Curtis, Sudbury, MA (US);

Maxim Gerard Smith, Natick, MA (US);

Inventors:

Paul Michael Curtis, Sudbury, MA (US);

Maxim Gerard Smith, Natick, MA (US);

Assignee:

Egenera, Inc., Marlboro, MA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04L 12/26 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method of and a system for autonomously identifying which node in a two-node system has failed are described. The system includes two nodes and a fault-tolerant communication fabric. The fabric defines a plurality of communication paths connecting the two nodes, and fault-tolerant loop-back communication in which each node can send a message to itself utilizing at least one switch structure of the fabric. In addition, each of the two nodes includes logic for performing the service; logic for testing the functionality of the respective node; logic for sending test result messages to both nodes; fault-isolation logic for analyzing test result messages from both nodes; and logic for disabling the other node from performing the service only if the fault-isolation logic determines that the respective node is capable of successfully performing the service and also determines that the other node is incapable of successfully performing the service.


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