The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7787318 B1

PDF
Full Text
Expired
Date of Patent:
Aug. 31, 2010

Filed:

Aug. 28, 2006
Applicant:

Katsuji Satomi, Osaka, JP;

Inventor:

Katsuji Satomi, Osaka, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G11C 29/00 (2006.01); G11C 7/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A semiconductor memory device is provided which can reliably detect a memory cell which has an unstable operation due to a small memory cell current. A bit line drive circuit is provided with respect to each pair of first and second bit lines, and has a configuration which can decrease a potential of a selected one of the pair of first and second bit lines. During a test operation, the first bit line in conduction with an H-side memory holding node of a memory cell is grounded for a predetermined time, thereby reducing a potential difference between the pair of first and second bit lines.


Find Patent Forward Citations

Satomi, Katsuji. (2010). Semiconductor memory device having read operation testing function (U.S. Patent No. 7787318). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7787318

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…