The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 31, 2010
Filed:
Jan. 31, 2007
Adam M. Zysk, Chicago, IL (US);
Steven G. Adie, Belmont, WA (US);
Matthew S. Leigh, Carlisle, WA (US);
Julian J. Armstrong, Carlisle, WA (US);
David D. Sampson, Fremantle, WA (US);
Stephen A. Boppart, Champaign, IL (US);
Adam M. Zysk, Chicago, IL (US);
Steven G. Adie, Belmont, WA (US);
Matthew S. Leigh, Carlisle, WA (US);
Julian J. Armstrong, Carlisle, WA (US);
David D. Sampson, Fremantle, WA (US);
Stephen A. Boppart, Champaign, IL (US);
The Board of Trustees of the University of Illinois, Urbana, IL (US);
Abstract
A method of analyzing tissue includes inserting a radiation source into tissue, impinging radiation upon the tissue, obtaining a sample signal of the radiation that impinges upon the tissue, and determining a refractive index of the tissue from the sample signal. The method may also include determining at least one other optical property of the tissue. The method may provide for identifying tissue as part of a biopsy method. A device for analyzing tissue may include a low-coherence interferometer and a probe optically coupled to the interferometer, where the probe includes a radiation source.