The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 31, 2010

Filed:

Apr. 25, 2008
Applicants:

Moon S. Kim, Silver Spring, MD (US);

Yud Ren Chen, Laurel, MD (US);

Kuanglin Chao, Ellicott City, MD (US);

Alan M. Lefcourt, Elkridge, MD (US);

Inventors:

Moon S. Kim, Silver Spring, MD (US);

Yud Ren Chen, Laurel, MD (US);

Kuanglin Chao, Ellicott City, MD (US);

Alan M. Lefcourt, Elkridge, MD (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/64 (2006.01);
U.S. Cl.
CPC ...
Abstract

A hyperspectral reflectance and fluorescence line-scan imaging system is used for on-line quality and safety inspection of agricultural commodities. The system simultaneously acquires hyperspectral/multispectral combinations of both fluorescence and reflectance images of the agricultural commodities.


Find Patent Forward Citations

Kim, Moon. (2010). Simultaneous acquisition of fluorescence and reflectance imaging techniques with a single imaging device for multitask inspection (U.S. Patent No. 7787111). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7787111

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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