The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 31, 2010
Filed:
Apr. 25, 2008
Applicants:
Moon S. Kim, Silver Spring, MD (US);
Yud Ren Chen, Laurel, MD (US);
Kuanglin Chao, Ellicott City, MD (US);
Alan M. Lefcourt, Elkridge, MD (US);
Inventors:
Moon S. Kim, Silver Spring, MD (US);
Yud Ren Chen, Laurel, MD (US);
Kuanglin Chao, Ellicott City, MD (US);
Alan M. Lefcourt, Elkridge, MD (US);
Assignee:
The United States of America as represented by the Secretary of Agriculture, Washington, DC (US);
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/64 (2006.01);
U.S. Cl.
CPC ...
Abstract
A hyperspectral reflectance and fluorescence line-scan imaging system is used for on-line quality and safety inspection of agricultural commodities. The system simultaneously acquires hyperspectral/multispectral combinations of both fluorescence and reflectance images of the agricultural commodities.