The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7786723 B1

PDF
Full Text
Expired
Date of Patent:
Aug. 31, 2010

Filed:

Aug. 19, 2008
Applicants:

David Oliver Burke, Balmain, AU;

Stephen John Sleijpen, Balmain, AU;

Jan Waszczuk, Balmain, AU;

Joseph Tharion, Balmain, AU;

Inventors:

David Oliver Burke, Balmain, AU;

Stephen John Sleijpen, Balmain, AU;

Jan Waszczuk, Balmain, AU;

Joseph Tharion, Balmain, AU;

Assignee:

Silverbrook Research Pty Ltd, Balmain, New South Wales, AU;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01); G01R 31/02 (2006.01);
U.S. Cl.
CPC ...
Abstract

This invention provides for a test stage for a printhead integrated circuit tester for testing operation of printhead integrated circuits mounted on a carrier. The test stage includes a support structure. A fixture is arranged on the support structure and is configured to receive and locate the carrier. A clamping mechanism is arranged on the fixture. The clamping mechanism has at least one clamp assembly for clamping the carrier to the test stage. A controller controls operation of the clamping mechanism.


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