The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 31, 2010
Filed:
Nov. 16, 2007
Douglas J. Wagenaar, Westlake Village, CA (US);
Bradley E. Patt, Sherman Oaks, CA (US);
Benjamin M. W. Tsui, Baltimore, MD (US);
Douglas J. Wagenaar, Westlake Village, CA (US);
Bradley E. Patt, Sherman Oaks, CA (US);
Benjamin M. W. Tsui, Baltimore, MD (US);
Gamma Medica-Ideas, Inc., Northridge, CA (US);
Abstract
Methods and systems for improving image quality of single photon nuclear imaging systems, such as single photon emission computed tomography (SPECT) systems for imaging of an object under study, such as small objects including small animals of different sizes using synthetic apertures. The methods and systems include processes and instrumentations for high-resolution, high detection efficiency leading to lower image noise and artifact-free synthetic aperture single photon nuclear images, such as SPECT images. Also, the method and systems provide design parameters, hardware settings, and data acquisition processes for optimal imaging of objects having different sizes.