The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 31, 2010
Filed:
Aug. 06, 2008
Long Hsu, Hsinchu, TW;
Cheng-hsien Liu, Hsinchu, TW;
Sheng-yang Tseng, Hsinchu, TW;
Chung-cheng Chou, Taoyuan County, TW;
William Wang, Taoyuan County, TW;
Fung-hsu Wu, Taoyuan County, TW;
Chen Peng, Taipei, TW;
Ta-yuan Lee, Taipei County, TW;
Long Hsu, Hsinchu, TW;
Cheng-Hsien Liu, Hsinchu, TW;
Sheng-Yang Tseng, Hsinchu, TW;
Chung-Cheng Chou, Taoyuan County, TW;
William Wang, Taoyuan County, TW;
Fung-Hsu Wu, Taoyuan County, TW;
Chen Peng, Taipei, TW;
Ta-Yuan Lee, Taipei County, TW;
Raydium Semiconductor Corporation, Hsinchu, TW;
Abstract
An apparatus and a method for changing optical tweezers are provided. The apparatus includes a diffractive optical element (DOE), a mask unit and an objective lens. The DOE includes a plurality of phase delay patterns. The mask unit includes a plurality of mask patterns that correspond to the phase delay patterns, respectively, wherein at least a portion of the mask patterns are complementary. A laser beam passing through each phase diffractive pattern correspondingly passes through each mask pattern to generate a compound diffractive pattern. The objective lens receives the compound diffractive pattern and focuses it on an examining object to form an optical tweezers.