The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 31, 2010
Filed:
Feb. 16, 2006
Applicants:
Steven J. Saul, Arlington, MA (US);
Mark E. Tess, Merrimack, NH (US);
Robert J. Markovsky, Brentwood, NH (US);
Inventors:
Steven J. Saul, Arlington, MA (US);
Mark E. Tess, Merrimack, NH (US);
Robert J. Markovsky, Brentwood, NH (US);
Assignee:
Charm Sciences, Inc., Lawrence, MA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 33/53 (2006.01);
U.S. Cl.
CPC ...
Abstract
A method and device for detecting analytes in a test sample. Embodiments include methods for quantitatively detecting analytes within a range of concentrations. In an embodiment the method includes a lateral flow test strip with multiple test areas for capturing a labeled receptor to provide a detectable signal.
Saul, Steven. (2010). Lateral flow test kit and method for detecting an analyte (U.S. Patent No. 7785899). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7785899
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile