The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 31, 2010
Filed:
Jun. 12, 2003
Applicants:
Michel Pérez, Dijon, FR;
Daniel Kolster, Oberkochen, DE;
Gerhard Gaida, Aalen, DE;
Peter Reimer, Ellwangen, DE;
Inventors:
Michel Pérez, Dijon, FR;
Daniel Kolster, Oberkochen, DE;
Gerhard Gaida, Aalen, DE;
Peter Reimer, Ellwangen, DE;
Assignee:
Carl Zeiss Surgical GmbH, Oberkochen, DE;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 3/10 (2006.01);
U.S. Cl.
CPC ...
Abstract
A cataract surgery microscopy system is provided which comprises a microscopy optics for producing an image of an object plane of the microscopy optics and a pattern generator for generating a pattern superimposed on the image, said pattern generator being provided to generate a circular pattern having an adjustable diameter.