The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 31, 2010
Filed:
Jan. 24, 2008
Steven F. Spiers, Richmond, VA (US);
Jeremy J. Straight, Midlothian, VA (US);
Travis M. Garthaffner, Midlothian, VA (US);
Janet L. Thompson, Chesterfield, VA (US);
Yeu-hwa Shyy, Midlothian, VA (US);
Steven F. Spiers, Richmond, VA (US);
Jeremy J. Straight, Midlothian, VA (US);
Travis M. Garthaffner, Midlothian, VA (US);
Janet L. Thompson, Chesterfield, VA (US);
Yeu-Hwa Shyy, Midlothian, VA (US);
Philip Morris USA Inc., Richmond, VA (US);
Abstract
Inspection systems and methods for their use comprise: a movable carrier with spaced receptacles, each sized to accept a sample; a first pin positioned proximate to the movable carrier and connected to a first movable member capable of reciprocally moving the first pin alternately into and out of contact with a first end of a sample disposed in one of the spaced receptacles; a second pin positioned proximate to the movable carrier and connected to a second movable member capable of reciprocally moving the second pin alternately into and out of contact with a second end of the sample disposed in the one of the spaced receptacles; a measurement sensor capable of determining a value associated with the sample disposed in the one of the spaced receptacles; and an evaluation device in communication with the measurement sensor for receiving the value, the evaluation device providing a comparison between the value and a predetermined value.