The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 31, 2010
Filed:
Feb. 21, 2007
Marc Dubois, Keller, TX (US);
Thomas E. Drake, Jr., Fort Worth, TX (US);
Kenneth Yawn, Weatherford, TX (US);
Mark Osterkamp, Weatherford, TX (US);
Marc Dubois, Keller, TX (US);
Thomas E. Drake, Jr., Fort Worth, TX (US);
Kenneth Yawn, Weatherford, TX (US);
Mark Osterkamp, Weatherford, TX (US);
Lockheed Martin Corporation, Bethesda, MD (US);
Abstract
An ultrasonic non-destructive evaluation (NDE) system operable to inspect target materials is provided. This ultrasonic NDE system includes an articulated robot, an ultrasound inspection head, a processing module, and a control module. The ultrasound inspection head couples to or mounts on the articulated robot. The ultrasound inspection head is operable to deliver a generation laser beam, a detection laser beam, and collect phase modulated light scattered by the target materials. The processing module processes the phase modulated light and produces information about the internal structure of the target materials. The control module directs the articulated robot to position the ultrasound inspection head according to a pre-determined scan plan.