The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 24, 2010

Filed:

May. 12, 2006
Applicants:

Chang-shing Perng, Goldens Bridge, NY (US);

Steve Lin, Florham Park, NJ (US);

Sheng MA, Briarcliff Manor, NY (US);

David Thoenen, Raleigh, NC (US);

Inventors:

Chang-Shing Perng, Goldens Bridge, NY (US);

Steve Lin, Florham Park, NJ (US);

Sheng Ma, Briarcliff Manor, NY (US);

David Thoenen, Raleigh, NC (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/15 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method and system for identifying relevant metrics among metrics that are measured to determine conformance with a service level agreement. The method includes selecting two sets of points, each set representing a given number of measurements for an individual metric and setting a separate threshold for each of the sets of points. The threshold values are selected to produce a set of quadrants so as to maximize distribution of points of intersection of each of the sets of points between a second quadrant and a fourth quadrant in a four-quadrant graph. The method can be performed on a computer system.


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