The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 24, 2010
Filed:
Dec. 13, 2005
Graham R. Cormode, Summit, NJ (US);
Minos N. Garofalakis, San Francisco, CA (US);
Shanmugavelayutham Muthukrishnan, Washington, DC (US);
Rajeev Rastogi, Bangalore, IN;
Graham R. Cormode, Summit, NJ (US);
Minos N. Garofalakis, San Francisco, CA (US);
Shanmugavelayutham Muthukrishnan, Washington, DC (US);
Rajeev Rastogi, Bangalore, IN;
Alcatel-Lucent USA Inc., Murray Hill, NJ (US);
Rutgers, The State University of New Jersey, New Brunswick, NJ (US);
Abstract
The invention comprises a method and apparatus for determining a rank of a query value. Specifically, the method comprises receiving a rank query request, determining, for each of the at least one remote monitor, a predicted lower-bound rank value and upper-bound rank value, wherein the predicted lower-bound rank value and upper-bound rank value are determined according to at least one respective prediction model used by each of the at least one remote monitor to compute the at least one local quantile summary, computing a predicted average rank value for each of the at least one remote monitor using the at least one predicted lower-bound rank value and the at least one predicted upper-bound rank value associated with the respective at least one remote monitor, and computing the rank of the query value using the at least one predicted average rank value associated with the respective at least one remote monitor.