The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 24, 2010
Filed:
Aug. 17, 2007
Marcus Felipe Fontoura, San Jose, CA (US);
Reiner Kraft, Gilroy, CA (US);
Tony Kai-chi Leung, San Jose, CA (US);
John A. Mcpherson, Jr., San Jose, CA (US);
Andreas Neumann, Gilroy, CA (US);
Runping Qi, Cupertino, CA (US);
Sridhar Rajagopalan, Oakland, CA (US);
Eugene J. Shekita, San Jose, CA (US);
Jason Yeong Zien, San Jose, CA (US);
Marcus Felipe Fontoura, San Jose, CA (US);
Reiner Kraft, Gilroy, CA (US);
Tony Kai-Chi Leung, San Jose, CA (US);
John A. McPherson, Jr., San Jose, CA (US);
Andreas Neumann, Gilroy, CA (US);
Runping Qi, Cupertino, CA (US);
Sridhar Rajagopalan, Oakland, CA (US);
Eugene J. Shekita, San Jose, CA (US);
Jason Yeong Zien, San Jose, CA (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
Provided is a technique for building an index. A new indexis built and an anchor text tableand a duplicates tableare output using a store, a delta store, and previously generated global analysis computations, wherein the previously generated global analysis computationsinclude an anchor text table, a rank table, and a duplicates table. New global analysis computationsare generated using the anchor text tablei+1, the duplicates table, and the previously generated global analysis computations.