The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 24, 2010
Filed:
Jun. 25, 2007
Alexander Gilgur, Sunnyvale, CA (US);
Michael F. Perka, Mountain View, CA (US);
Alexander Gilgur, Sunnyvale, CA (US);
Michael F. Perka, Mountain View, CA (US);
Quest Software, Inc., Aliso Viejo, CA (US);
Abstract
A methodology for automatic a priori data pattern analysis is provided. Described methods allow consistent and objective determination of outliers; trend; seasonality; and level shifts; and the production of better models and more accurate forecasts. In addition, a two-step way to automatically determine seasonality and locate possible events in the data set is described. Decomposition of data into seasonal, trend and level components; detection of outliers and level-shift events in the time series based on statistical analysis of the time series; detection of seasonality based on statistical analysis of clusters of data, known as cluster-based seasonality analysis, or CBSA; evaluation of the goodness of fit of a model to data, using the existing goodness of fit indicator, R; and seasonality analysis, using a sequence of cluster-based seasonality analysis (CBSA) and Fourier analysis are described.