The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 24, 2010
Filed:
Jun. 22, 2007
Ricardo Claps, San Jose, CA (US);
Ricardo Claps, San Jose, CA (US);
Other;
Abstract
An optical system employs filtered broad band light for determining the specific components in a material sample. The system forms an r by n matrix C representing r principal components of the measurement to be analyzed at n different frequencies. Each sample contains a known quantity of the different materials in the sample being analyzed where r represents the number of different analytes or components in the sample. The system measures m different samples at n different frequencies, said m samples containing unknown quantities of the material, where 'm' is a selected integer representing the number of samples. Using the measured results from the m samples the system forms an n by m matrix P, where P=C·R, and where R is an m by r matrix representing r unknown values of the r principal components which are being measured in the m material samples. The system then solves the equation P=C·R for R by inverting C in the equation=() This gives the value of each of the r principal components in the sample.