The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 24, 2010
Filed:
Jul. 28, 2006
Thomas Orth, Mülheim/a.d. Ruhr, DE;
Stefan Nitsche, Mülheim/a.d. Ruhr, DE;
Till Schmitte, Bochum, DE;
Thomas Orth, Mülheim/a.d. Ruhr, DE;
Stefan Nitsche, Mülheim/a.d. Ruhr, DE;
Till Schmitte, Bochum, DE;
V & M Deutschland GmbH, Düsseldorf, DE;
Abstract
A method for nondestructive testing of the pipes for detecting surface flaws using magnetic leakage flux is disclosed. With of the method, flaws can be detected and analyzed in near-real-time while the pipe is produced. The data obtained with inductive coils, Hall sensors or GMR sensors are digitized, the digital data are buffered in a first memory, and a subset of the digital data are copied into a second memory. The copied data are transformed with a wavelet transformation and the resulting wavelet coefficients are filtered and/or modified. In an alternative embodiment, the digital data can be continuously supplied to a routine for wavelet transformation, which is performed using cascaded digital signal processing routines. The evaluated variable is compared with a reference value, wherein a determined flaw-based signal can be unambiguously associated with the position of the flaw.