The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 24, 2010
Filed:
Jun. 29, 2005
Applicants:
Patrick Y. Hwang, Marion, IA (US);
R. Grover Brown, Clear Lake, IA (US);
Inventors:
Patrick Y. Hwang, Marion, IA (US);
R. Grover Brown, Clear Lake, IA (US);
Assignee:
Rockwell Collins, Inc., Cedar Rapids, IA (US);
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01C 21/30 (2006.01); G01C 21/00 (2006.01); G01C 21/32 (2006.01);
U.S. Cl.
CPC ...
Abstract
An integrity monitoring method for an aircraft is disclosed. The integrity monitoring method includes determining a set of non-uniform weights. The non-uniform weights are based on a least squares approximation of a linearized measurement equation. The integrity monitoring method also includes applying the non-uniform weights in a receiver autonomous integrity monitoring (RAIM) system. Further, the integrity monitoring method includes determining a reduced integrity limit based on the output of the RAIM system.