The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 24, 2010

Filed:

Jun. 05, 2006
Applicants:

Marc D. Feldman, San Antonio, TX (US);

Thomas E. Milner, Austin, TX (US);

Jung Hwan OH, Austin, TX (US);

Eunha Kim, Austin, TX (US);

Karthik Kumar, Austin, TX (US);

Chris Condit, Austin, TX (US);

Robert Grant, Austin, TX (US);

Nate Kemp, Austin, TX (US);

Jeehyun Kim, Irvine, CA (US);

Shaochen Chen, Austin, TX (US);

Li-hsin Han, Austin, TX (US);

Inventors:

Marc D. Feldman, San Antonio, TX (US);

Thomas E. Milner, Austin, TX (US);

Jung Hwan Oh, Austin, TX (US);

Eunha Kim, Austin, TX (US);

Karthik Kumar, Austin, TX (US);

Chris Condit, Austin, TX (US);

Robert Grant, Austin, TX (US);

Nate Kemp, Austin, TX (US);

Jeehyun Kim, Irvine, CA (US);

Shaochen Chen, Austin, TX (US);

Li-Hsin Han, Austin, TX (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 5/05 (2006.01);
U.S. Cl.
CPC ...
Abstract

An apparatus is disclosed for studying an object based on at least one of polarization, space, position or angle of light that has reflected from the object. An optical tomographic instrumentation of the apparatus includes a light source coupled to a source path, a sample path, a reference path, and a detection path, wherein the light source generates a spectrally resolved bandwidth. The spectrally resolved bandwidth includes a plurality of spectrally resolved cells and a detector in the detection path for analyzing light reflected from an object in the sample path and the light reflected in the reference path based upon at least one of the polarization, spatial relationship, position or angle domains.


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