The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 24, 2010

Filed:

Aug. 23, 2007
Applicant:

Yasuyuki Miyaoka, Yokohama, JP;

Inventor:

Yasuyuki Miyaoka, Yokohama, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G11B 7/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method of adjusting spherical aberration correction and focus offset of a light beam. A first approximate straight line is detected indicating a first relationship between the spherical aberration correction and the focus offset according to a first evaluation index indicating a quality of cross-track signal. A second approximate straight line is detected indicating a second relationship between the spherical aberration correction and the focus offset according to a second evaluation index indicating a quality of a reproduced signal. A spherical aberration correction value and a focus offset value, to be adjusted, are determined from an intersection of the first approximate straight line and the second approximate straight line.


Find Patent Forward Citations

Loading…