The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 24, 2010
Filed:
May. 05, 2009
Hiroya Fukuyama, Machida, JP;
Yoshihisa Tanikawa, Chuo-ku, JP;
Tadashi Hirata, Hachioji, JP;
Seiya Takahashi, Saitama, JP;
Hiroya Fukuyama, Machida, JP;
Yoshihisa Tanikawa, Chuo-ku, JP;
Tadashi Hirata, Hachioji, JP;
Seiya Takahashi, Saitama, JP;
Olympus Corporation, Tokyo, JP;
Abstract
A microscope examination apparatus including a light source; an illumination optical system configured to guide light from the light source to a specimen; an objective lens configured to collimate return light from the specimen, the objective lens being provided in such a manner as to be displaceable at least in a direction intersecting an optical axis of the objective lens; an image-forming lens configured to image the return light from the specimen, which is collimated by the objective lens; an optical detector configured to detect the return light imaged by the image-forming lens; a microscope main body including the image-forming lens and the optical detector; and an objective-lens driving mechanism configured to drive the objective lens in a direction correcting image blur due to a displacement of the specimen.