The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 24, 2010

Filed:

May. 07, 2008
Applicants:

Maziar Sardashti, Bartlesville, OK (US);

Frank J. Mcenroe, Ponca City, OK (US);

David J. Blumer, Bartlesville, OK (US);

Inventors:

Maziar Sardashti, Bartlesville, OK (US);

Frank J. McEnroe, Ponca City, OK (US);

David J. Blumer, Bartlesville, OK (US);

Assignee:

ConocoPhillips Company, Houston, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 3/44 (2006.01); G01N 21/65 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method of analyzing an effect of a first substance on the behavior of a second substance comprises exposing a test material to the first substance, performing a first surface enhanced Raman spectroscopy analysis of the test material while it is exposed to the first substance, exposing the test material to the first substance and to the second substance, and performing a second surface enhanced Raman spectroscopy analysis of the test material while it is exposed to the first substance and to the second substance. Results of the first and second analyses are compared to identify a change in the behavior of the first substance.


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