The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 24, 2010
Filed:
Jun. 14, 2007
Alexander Berestov, San Jose, CA (US);
Ted J. Cooper, Sunnyvale, CA (US);
Kenichi Nishio, Yokohama, JP;
Masaya Kinoshita, Yokohama, JP;
Ting Zhang, Tokyo, JP;
Alexander Berestov, San Jose, CA (US);
Ted J. Cooper, Sunnyvale, CA (US);
Kenichi Nishio, Yokohama, JP;
Masaya Kinoshita, Yokohama, JP;
Ting Zhang, Tokyo, JP;
Sony Corporation, Tokyo, JP;
Sony Electronics Inc., Park Ridge, NJ (US);
Abstract
A system for and method of determining calibration parameters while only capturing a single image is described herein. Furthermore, traditional calibration algorithms are avoided by the direct determination of the calibration parameters. The determination of the calibration parameters is possible by first determining a training data set from images acquired of a variety of objects with a multitude of colors. Then, using the training data set, regression coefficients are generated. A camera to be calibrated then acquires only one set of image information such as a single picture. Then, using the regression coefficients and the acquired information, the calibration parameters are directly estimated for that camera.