The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 24, 2010

Filed:

Mar. 24, 2006
Applicants:

Keiichi Nemoto, Kanagawa, JP;

Nobuhiro Yamasaki, Kanagawa, JP;

Takashi Sonoda, Kanagawa, JP;

Masakazu Fujimoto, Kanagawa, JP;

Noriyuki Kurabayashi, Kanagawa, JP;

Masamichi Takahashi, Kanagawa, JP;

Inventors:

Keiichi Nemoto, Kanagawa, JP;

Nobuhiro Yamasaki, Kanagawa, JP;

Takashi Sonoda, Kanagawa, JP;

Masakazu Fujimoto, Kanagawa, JP;

Noriyuki Kurabayashi, Kanagawa, JP;

Masamichi Takahashi, Kanagawa, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 11/20 (2006.01); G09G 5/22 (2006.01);
U.S. Cl.
CPC ...
Abstract

In a statistical variable display apparatus, first lengths along a first axis and second lengths along a second axis are determined. The first lengths are respectively allotted to first-type subgroups, and the second lengths are respectively allotted to the second-type subgroups. The apparatus displays the first-type subgroups arranged along the first axis to have the respective first lengths, the second-type subgroups arranged along the second axis to have the respective second lengths, and representations of acquired statistical variables correspondingly to a respective one of the first-type subgroups arranged along the first axis and a respective one of the second-type subgroups arranged along the second axis.


Find Patent Forward Citations

Loading…