The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 24, 2010
Filed:
Sep. 05, 2008
Yu Kuang, Hsinchu, TW;
Yu Kuang, Hsinchu, TW;
Raydium Semiconductor Corporation, Hsinchu, TW;
Abstract
A measurement method for capacitance includes the following steps. First, a voltage on at least one end of a to-be-measured capacitor is switched in response to a first set of clock signals such that a level of an integrated voltage is adjusted from a start voltage level to an end voltage level in a first integration period, wherein a capacitance of the to-be-measured capacitor is relevant to a difference between the end voltage level and the start voltage level. Next, the level of the integrated voltage is adjusted from the end voltage level to the start voltage level in a second integration period in response to a second set of clock signals. Then, the capacitance of the to-be-measured capacitor is obtained according to the first and second integration periods and a known characteristic parameter.