The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 24, 2010
Filed:
Dec. 12, 2008
Olivier Noterdaeme, Oxford, GB;
Michael Brady, Oxford, GB;
Olivier Noterdaeme, Oxford, GB;
Michael Brady, Oxford, GB;
Isis Innovation Ltd., Summertown, Oxford, GB;
Abstract
Intensity inhomogeneities can obscure areas of interest and are problematic for MR image segmentation algorithms. An efficient approach to estimating these inhomogeneities by computing a calibration factor that is a function of an estimated bias field from a series of calibration scans is disclosed. This enables correction of TW and TW images by reducing inhomogeneities without the need to map Tand T. Because of interest in the shape of the intensity inhomogeneities a limited number of flip angles yield satisfactory performance. Additionally, an RF transmit field Bcan be estimated and inhomogeneities resulting from the Bfield reduced from the MR image using the estimated Bfield.