The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 24, 2010

Filed:

Apr. 30, 2008
Applicant:

Alexey Fishkin, Munich, DE;

Inventor:

Alexey Fishkin, Munich, DE;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01V 3/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

In a method for determination of the measurement workflow of a magnetic resonance tomography apparatus in the generation of slice images of a subject, a number of slice images to be generated is established. A total number of measurement regions is established for each of the slice images, with one measurement being necessary for the acquisition of the data of each of the measurement regions. An individual measurement sequence is determined for each slice image, comprising an excitation and a determined number of successive measurements of different measurement regions of the appertaining slice image, with a number of measurement sequences being necessary for acquisition of all measurement regions of the appertaining slice image. The individual measurement sequences are to be distributed to a determined number of measurement streams is determined. An order is established as to the distribution of the entirety of measurements of a respective slice image among the measurement streams.


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