The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 24, 2010

Filed:

May. 27, 2007
Applicants:

Yongdong Wang, Wilton, CT (US);

Ming Gu, Yardley, PA (US);

Inventors:

Yongdong Wang, Wilton, CT (US);

Ming Gu, Yardley, PA (US);

Assignee:

Cerno Bioscience LLC, Danbury, CT (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B01D 59/44 (2006.01); H01J 49/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for analyzing data from a mass spectrometer comprising obtaining calibrated continuum spectral data by processing raw spectral data; obtaining library spectral data which has been processed to form calibrated library data; and performing a least squares fit, preferably using matrix operations (equation 1), between the calibrated continuum spectral data and the calibrated library data to determine concentrations of components in a sample which generated the raw spectral data. A mass spectrometer system (FIG.) that operates in accordance with the method, a data library of transformed mass spectra, and a method for producing the data library.


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