The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 24, 2010
Filed:
Oct. 14, 2005
Katsumasa Fujita, Osaka, JP;
Satoshi Kawata, Osaka, JP;
Osamu Nakamura, Osaka, JP;
Naoko Nakamura, Legal Representative, Osaka, JP;
Minoru Kobayashi, Osaka, JP;
Katsumasa Fujita, Osaka, JP;
Satoshi Kawata, Osaka, JP;
Osamu Nakamura, Osaka, JP;
Naoko Nakamura, legal representative, Osaka, JP;
Minoru Kobayashi, Osaka, JP;
Osaka University, Suita-shi, Osaka, JP;
Abstract
To increase spatial resolution by observing a sample based on saturated fluorescence components. A fluorescence microscope according to the present invention includes: a laser light sourceemitting laser light as excitation light; an objective lensfocusing the laser light and applying the focused laser light to a sample; a detectordetecting fluorescence generated in the samplewith the laser light; and a stagescanning the samplewhile moving the samplerelative to the laser light, wherein the laser light is applied to the sample with varying intensities such that saturation of fluorescence occurs at the maximum intensity of the laser light, and fluorescence is detected with the detector in accordance with intensity of the laser light, and the sample is observed based on the saturation components of fluorescence.