The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 24, 2010
Filed:
Nov. 20, 2003
Hironori Kakiuchi, Tokyo, JP;
Hiroyasu Inoue, Tokyo, JP;
Hironori Kakiuchi, Tokyo, JP;
Hiroyasu Inoue, Tokyo, JP;
TDK Corporation, Tokyo, JP;
Abstract
An optical recording medium includes a substrate, a protective layer and a plurality of information recording layers between the substrate and the protective layer and capable of recording data in the plurality of information recording layers and reproducing data recorded in the plurality of information recording layers by projecting a laser beam via a light incidence plane constituted by one of the surfaces of the substrate and protective layer onto the plurality of information recording layers, each of the information recording layers other than a farthest information recording layer from the light incidence plane including two recording films, a first dielectric film located on the side of the light incidence plane with respect to the two recording films and containing an oxide as a primary component and added with nitrogen, and a second dielectric film located on the opposite side of the light incidence plane with respect to the two recording films and having a lower thermal conductivity than that of the first dielectric film. According to the thus constituted optical recording medium, it is possible to improve the heat radiation characteristic and the optical property of information recording layers other than the information recording layer farthest from the light incidence plane.