The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 24, 2010
Filed:
Nov. 21, 2006
Yukinori Iizuka, Kanagawa, JP;
Yukinori Iizuka, Kanagawa, JP;
JFE Steel Corporation, Tokyo, JP;
Abstract
Disclosed are an ultrasonic testing system and an ultrasonic testing technique for a pipe member capable of detecting minute flaws of several hundreds of microns or less located at positions in the wall thickness inside portion of a welded portion of a seam-welded pipe and the like without omission and further easily setting optimum conditions when the size of the pipe is changed. A transmitting beam, which is focused to the welded portion at an oblique angle, is transmitted using a part of the group of transducer elements of a linear array probe as a group of transducer elements for transmission, a receiving beam, which is focused at the focusing position of the transmitting beam at an oblique angle, is formed using the transducer elements of a portion different from the above group of transducer elements for transmission as a group of transducer elements for reception, and a flaw echo is received from the welded portion.