The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 24, 2010
Filed:
Nov. 27, 2007
Lei LI, Shenzhen, CN;
Zhi Cheng, Shenzhen, CN;
Ping Chen, Shenzhen, CN;
Ji-wen Yang, Shenzhen, CN;
Lin-sen Dong, Shenzhen, CN;
Chang-fa Sun, Shenzhen, CN;
Lei Li, Shenzhen, CN;
Zhi Cheng, Shenzhen, CN;
Ping Chen, Shenzhen, CN;
Ji-Wen Yang, Shenzhen, CN;
Lin-Sen Dong, Shenzhen, CN;
Chang-Fa Sun, Shenzhen, CN;
Shenzhen Futaihong Precision Industry Co., Ltd., ShenZhen, Guangdong Province, CN;
FIH (Hong Kong) Limited, Kowloon, HK;
Abstract
A measuring system () for flatness degree measurement includes a measuring instrument () and a processing device (). The measuring instrument has a base (), a guide column (), a sliding member (), a digital micrometer () and a holding member (). The guide column is vertically attached to the base. The sliding member is moveably attached to the guide column. The digital micrometer is firmly fastened to the sliding member. The holding member is configured for fixing a workpiece () and has a reference-standard surface formed thereon. The processing device electronically connects with the digital micrometer. The processing device receives a plurality of measured values from the digital micrometer and displays a testing result after processing the measured values.