The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 17, 2010

Filed:

Dec. 23, 2005
Applicants:

Danish Hasan Syed, Okhla, New Delhi - 110 025, IN;

Vishal Kumar Srivastava, Lucknow 2266016, UP, IN;

Inventors:

Danish Hasan Syed, Okhla, New Delhi - 110 025, IN;

Vishal Kumar Srivastava, Lucknow 2266016, UP, IN;

Assignee:

Other;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01); G06F 11/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A self test structure for interconnect and logic element testing in programmable devices including a plurality of logic elements; an interconnect structure for connecting the logic elements; SRAM based configuration latches for configuring the interconnect structure; test configuration circuitry for configuring any desired set of logic elements, interconnect structure and configuration latches during reset state that links the logic elements and interconnect structure to form a complete path between the interface points of the programmable logic device to enable testing of the desired elements in the complete path.


Find Patent Forward Citations

Syed, Danish. (2010). Self test structure for interconnect and logic element testing in programmable devices (U.S. Patent No. 7779318). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7779318

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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