The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 17, 2010

Filed:

Dec. 28, 2006
Applicants:

Amanuel Ronen Artzi, Framingham, MA (US);

Viren Pherwani, Shrewsbury, MA (US);

Ron Even, Fairfield, CT (US);

William Kuhhirte, Redington Shores, FL (US);

Inventors:

Amanuel Ronen Artzi, Framingham, MA (US);

Viren Pherwani, Shrewsbury, MA (US);

Ron Even, Fairfield, CT (US);

William Kuhhirte, Redington Shores, FL (US);

Assignee:

EMC Corporation, Hopkinton, MA (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 15/173 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method, apparatus and computer program product for performing an analysis on a Storage Area Network (SAN) system, containing a plurality of components, is disclosed. The method comprises the steps of representing selected ones of the plurality of components and the relationship among the components, wherein the representation comprises the steps of creating at least one non-specific representation of the selected components and creating at least one non-specification representation of relations along which the events propagate amongst the selected components, providing a mapping between a plurality events and a plurality of observable events occurring among the components, wherein the mapping is represented as a value associating each event with each observable event, and performing the system analysis based on the mapping of events and observable events.


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