The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 17, 2010

Filed:

Aug. 11, 2008
Applicants:

Derrick Higgins, Highland Park, NJ (US);

Klaus Zechner, Princeton, NJ (US);

Yoko Futagi, Lawrenceville, NJ (US);

Rene Lawless, Pennington, NJ (US);

Inventors:

Derrick Higgins, Highland Park, NJ (US);

Klaus Zechner, Princeton, NJ (US);

Yoko Futagi, Lawrenceville, NJ (US);

Rene Lawless, Pennington, NJ (US);

Assignee:

Educational Testing Service, Princeton, NJ (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G10L 11/00 (2006.01); G10L 17/00 (2006.01); G10L 15/04 (2006.01); G10L 15/18 (2006.01); G10L 13/00 (2006.01); G10L 13/08 (2006.01); G10L 21/06 (2006.01); G10L 21/00 (2006.01); G06F 17/27 (2006.01); G09B 19/00 (2006.01); G09B 19/04 (2006.01); G09B 7/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

The present disclosure presents a useful metric for assessing the relative difficulty which non-native speakers face in pronouncing a given utterance and a method and systems for using such a metric in the evaluation and assessment of the utterances of non-native speakers. In an embodiment, the metric may be based on both known sources of difficulty for language learners and a corpus-based measure of cross-language sound differences. The method may be applied to speakers who primarily speak a first language speaking utterances in any non-native second language.


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