The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7778700 B1

PDF
Full Text
Expired
Date of Patent:
Aug. 17, 2010

Filed:

May. 08, 2007
Applicants:

Hyun Wook Park, Daejeon, KR;

Sung Suk OH, Daegu, KR;

Jun-young Chung, Incheon, KR;

Inventors:

Hyun Wook Park, Daejeon, KR;

Sung Suk Oh, Daegu, KR;

Jun-Young Chung, Incheon, KR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 5/05 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for measuring a brain wave comprises extracting positive and negative peaks from an electrocardiogram (EKG) signal reflecting heartbeat information, and positive peaks from an electroencephalogram (EEG) signal reflecting heartbeat-caused noise information and brain wave information. The positive peaks of the EEG signal are classified into a first peak group and a second peak group based on the positive peaks of the EKG signal. The first peak group is affected more greatly by the heartbeat than by the brain wave, and the second peak group is affected more greatly by the brain wave than by the heartbeat. Noise of the first and second peak groups is removed from the EEG signal.


Find Patent Forward Citations

Park, Hyun. (2010). Brain wave measuring method, apparatus and computer readable recording medium implemented with program for executing the method (U.S. Patent No. 7778700). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7778700

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