The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 17, 2010
Filed:
Sep. 10, 2007
Mark A. Omelchenko, Lexington, KY (US);
Mark A. Omelchenko, Lexington, KY (US);
Lexmark International, Inc., Lexington, KY (US);
Abstract
A method of compensating for mechanical and magnification errors affecting toner density control in an image forming device is described herein. The method includes directing light towards a toner test surface, sensing the resulting reflections, and buffering the density data corresponding to the sensed reflections during a predetermined test window. The method may compensate for mechanical and magnification errors associated with the toner test pattern by processing the buffered density data to adjust the location of the data collection windows corresponding to the toner test patterns. For example, the buffered density data may be processed to detect first and second boundary patterns disposed on the toner test surface within the test window, determine a time differential between the first and second boundary patterns, and adjust the location of the data collection windows based on the determined time differential and a nominal expected time differential.