The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 17, 2010
Filed:
Jun. 24, 2008
Applicant:
Akio Yoneyama, Kawagoe, JP;
Inventor:
Akio Yoneyama, Kawagoe, JP;
Assignee:
Hitachi, Ltd., Tokyo, JP;
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 23/207 (2006.01); G01N 23/201 (2006.01); G03H 5/00 (2006.01); G21K 1/06 (2006.01);
U.S. Cl.
CPC ...
Abstract
The present invention provides an X-ray imaging system and method capable of performing time-resolved observation in a short measurement time at the same density resolution and in the same dynamic range as those for a diffraction enhanced X-ray imaging method, and also capable of observing a sample with high sensitivity even if the intensity of an incident X-ray varies with time. A refraction angle of X-ray beams caused by the sample is detected at a time by X-ray imagers by utilizing multiple X-ray diffractions by multiple analyzer crystals.