The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 17, 2010
Filed:
Mar. 14, 2007
Thomas Koehler, Norderstedt, DE;
Jens-peter Schlomka, Hamburg, DE;
Thomas Koehler, Norderstedt, DE;
Jens-Peter Schlomka, Hamburg, DE;
Koninklijke Philips Electronics N.V., Eindhoven, NL;
Abstract
It is described a method and a CT system for measuring dual-energy X- ray attenuation data of an object. The CT system comprises a rotatable holder, an X-ray source comprising two different X-ray focus points, and an X-ray detection device comprising a plurality of detector elements exhibiting different spectral sensitivities. The method comprises the steps of (a) adjusting the X-ray source such that it emits X-rays originating a first focus point, (b) acquiring first attenuation data separately with first detector elements and with second detector elements, (c) moving the X-ray focus discretely to a second focus point, and (d) acquiring second attenuation data separately with both types of detector elements. Thereby the two focus points are spatially separated from each such that a first beam path originating from the first focus point penetrates a certain voxel within the object and impinges on a first detector element and a second beam path originating from the second X-ray focus point penetrates the same voxel and impinges on a second detector element.