The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 17, 2010

Filed:

Nov. 29, 2005
Applicants:

Kapil Shrikhande, Berkeley, CA (US);

Raghvendra G. Savoor, Walnut Creek, CA (US);

Xidong Wu, Livermore, CA (US);

Jin Wang, Walnut Creek, CA (US);

John Van Slyke, Lafayette, CA (US);

Richard D. Hart, Concord, CA (US);

Inventors:

Kapil Shrikhande, Berkeley, CA (US);

Raghvendra G. Savoor, Walnut Creek, CA (US);

Xidong Wu, Livermore, CA (US);

Jin Wang, Walnut Creek, CA (US);

John Van Slyke, Lafayette, CA (US);

Richard D. Hart, Concord, CA (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04L 12/26 (2006.01);
U.S. Cl.
CPC ...
Abstract

A system and method to perform double-ended measurements of a network is provided. The system includes a test device that makes measurements at the customer end and a portable computing device that interfaces with the test device, a customer gateway and database at a network location to analyze the data and determine a performance metric of the network.


Find Patent Forward Citations

Loading…