The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 17, 2010
Filed:
Jan. 11, 2005
Applicants:
Gerhard Moller, Aalen, DE;
Peter Andrews, Oberkochen, DE;
Peter Reimer, Ellwangen, DE;
Inventors:
Assignee:
Carl Zeiss Surgical GmbH, , DE;
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B 9/08 (2006.01);
U.S. Cl.
CPC ...
Abstract
An aperture stop device is provided for use in a microscope with at least one adjustable observation parameter. The aperture stop device includes at least one aperture stop () with an adjustable aperture, that is to say with an adjustable stop opening. The aperture stop () is adapted to receive an aperture signal representative of an aperture to be adjusted. In addition the aperture stop device includes a control unit () for output of the aperture signal to the aperture stop () in dependence at least on the respectively set value of the observation parameter of the microscope.