The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 17, 2010
Filed:
Aug. 25, 2006
Applicant:
Klaus-peter Zimmer, Heerbrugg, CH;
Inventor:
Klaus-Peter Zimmer, Heerbrugg, CH;
Assignee:
Leica Instruments (Singapore) Pte. Ltd., Singapore, SG;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/22 (2006.01);
U.S. Cl.
CPC ...
Abstract
A stereomicroscope of the Greenough type includes a first monocular microscope and a second monocular microscope, which define a first beam path and a second beam path, respectively, wherein the first and second microscopes are arranged at a convergence angle to one another and comprise magnification systems for producing equal magnifications which can be varied synchronously with one another. At least one optical element in the first microscope has a different optically effective diameter compared to at least one corresponding optical element in the second microscope.