The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 17, 2010

Filed:

Jun. 15, 2006
Applicants:

Chung-hui Kuo, Fairport, NY (US);

Eric K. Zeise, Pittsford, NY (US);

Di Lai, Rochester, NY (US);

Inventors:

Chung-Hui Kuo, Fairport, NY (US);

Eric K. Zeise, Pittsford, NY (US);

Di Lai, Rochester, NY (US);

Assignee:

Eastman Kodak Company, Rochester, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 15/00 (2006.01); H04N 1/46 (2006.01); G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A color image control system and method are provided for improving the image control of printing systems, including digital front-end processors, color printers and post-finishing system. This automatic image control system, including measurement and calibration, by registering the captured reproduced document with the extracted virtual device document and automatically locating a plurality of regions in which to measure captured color values, using colorimetric measurements of an aim reproduction of the document at these same region positions, and finally relating the captured color values, the colorimetric color values, and the virtual device color values to create the an accurate color mapping. One embodiment of this method combines a global regression polynomial with local mapping refinement.


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