The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 17, 2010
Filed:
Dec. 21, 2007
Applicants:
Tsutomu Kikawa, Tokyo, JP;
Hiroaki Okada, Tokyo, JP;
Takefumi Hayashi, Tokyo, JP;
Hisashi Tsukada, Tokyo, JP;
Yasufumi Fukuma, Tokyo, JP;
Inventors:
Tsutomu Kikawa, Tokyo, JP;
Hiroaki Okada, Tokyo, JP;
Takefumi Hayashi, Tokyo, JP;
Hisashi Tsukada, Tokyo, JP;
Yasufumi Fukuma, Tokyo, JP;
Assignee:
Kabushiki Kaisha Topcon, Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 11/02 (2006.01);
U.S. Cl.
CPC ...
Abstract
A fundus oculi observation device acts as an optical image measurement device capable of measuring an OCT image such as a tomographic image of a fundus oculi, or the like, and is configured so as to calculate the signal level of the formed OCT image, determine whether the signal level exceeds a threshold value, and change the position of a reference mirror so that the signal level is determined to exceed the threshold value.