The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 17, 2010

Filed:

Jun. 10, 2008
Applicants:

Ronald A. Synowicki, Lincoln, NE (US);

Thomas E. Tiwald, Lincoln, NE (US);

Inventors:

Ronald A. Synowicki, Lincoln, NE (US);

Thomas E. Tiwald, Lincoln, NE (US);

Assignee:

J.A. Woollam Co., Inc., Lincoln, NE (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J 4/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A system for reducing reflections of a beam of electromagnetic radiation from the opposite, back, surface of an anisotropic sample, including methodology for investigating the incident, front, surface thereof with electromagnetic radiation, and analyzing the data as if the sample is isotropic.


Find Patent Forward Citations

Synowicki, Ronald. (2010). Ellipsometric investigation of anisotropic samples (U.S. Patent No. 7777883). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7777883

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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