The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 17, 2010
Filed:
Apr. 23, 2008
Katsushige Nakamura, Tokyo, JP;
Katsuhiro Miura, Tokyo, JP;
Katsushige Nakamura, Tokyo, JP;
Katsuhiro Miura, Tokyo, JP;
Mitaka Kohki Co., Ltd., Tokyo, JP;
Abstract
A noncontact form measuring apparatus emits a laser beam L. In the apparatus, a prism bends the laser beam into an X-axis direction, so that a Z-axis displacement of an objective optical system is converted by the prism into an X-axis displacement on a measurement coordinate system. A movement of an X-axis stage is converted into a Z-axis displacement on the measurement coordinate system. The apparatus moves an internal gear as a measurement object and the prism, reads X, Y, and Z coordinates at each focal point, and measures a three-dimensional form of inner teeth of the internal gear. The apparatus may translate the internal gear in a Y-axis direction, to measure a partial form of the inner teeth. The apparatus may turn the internal gear in an angular θ-direction, to measure a whole circumferential form of the inner teeth.