The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 17, 2010
Filed:
Jan. 18, 2005
Yee S. NG, Fairport, NY (US);
Eric K. Zeise, Pittsford, NY (US);
Yee S. Ng, Fairport, NY (US);
Eric K. Zeise, Pittsford, NY (US);
Eastman Kodak Company, Rochester, NY (US);
Abstract
Image quality assessment test charts and objective image quality measurement systems may be used to evaluate the printer sub-system health before artifacts become objectionable to human observers. Diagnostic images may be printed to allow measurement of a number of system performance attributes, such as: density, banding, streak, granularity, mottle, color, gloss, gloss uniformity, edge gradient, raggedness, sharpness, background, registration, line width, and satellite measurements. By comparing these measurements to historical values or ideal values of the same measurements, preventive maintenance suggestions may be generated to avoid both unnecessary maintenance and objectionable print quality.