The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 17, 2010
Filed:
Aug. 27, 2003
Steven R. Reznek, Concord, MA (US);
Ian D. Morrison, Acton, MA (US);
Meng-jiao Wang, Lexington, MA (US);
Steven E. Brown, Tyngsboro, MA (US);
Martin C. Green, Boxboro, MA (US);
William L. Sifleet, Clinton, MA (US);
Lawrence J. Murphy, Bedford, MA (US);
Steven R. Reznek, Concord, MA (US);
Ian D. Morrison, Acton, MA (US);
Meng-Jiao Wang, Lexington, MA (US);
Steven E. Brown, Tyngsboro, MA (US);
Martin C. Green, Boxboro, MA (US);
William L. Sifleet, Clinton, MA (US);
Lawrence J. Murphy, Bedford, MA (US);
Cabot Corporation, Boston, MA (US);
Abstract
The present invention relates to a method of providing product consistency of a particulate material or the product containing the same, by measuring and/or analyzing at least one interfacial potential property value of the particulate material. The method may be used as a QA/QC method to insure product consistency.