The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 17, 2010

Filed:

Jun. 10, 2008
Applicants:

Nobuo Saito, Tokyo, JP;

Yasuhide Takahashi, Tokyo, JP;

Kenichi Takahashi, Tokyo, JP;

Yuuichi Kimura, Tokyo, JP;

Inventors:

Nobuo Saito, Tokyo, JP;

Yasuhide Takahashi, Tokyo, JP;

Kenichi Takahashi, Tokyo, JP;

Yuuichi Kimura, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 3/10 (2006.01);
U.S. Cl.
CPC ...
Abstract

An instrument for measuring a refractive power including an astigmatic axis with retinoscopy is provided, which includes a projector, a light receiving device, a detector, and a notification unit. The projector projects light into a pupil of an examined eye. The light receiving device receives light reflected from the examined eye. The detector detects a tilt angle of the light receiving device with respect to a measurement reference. The notification unit conveys information related to a result of detection performed by the detector.


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