The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 10, 2010

Filed:

Sep. 29, 2005
Applicant:

Daniel H. Hardman, American Fork, UT (US);

Inventor:

Daniel H. Hardman, American Fork, UT (US);

Assignee:

Symantec Corporation, Mountain View, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Automated estimation that a hardware or software change is correlated with one or more problem events. In addition to identifying that a change has occurred, one or more problem events are identified that have occurred after the change. Problem events are then correlated with the change using a distance measure between the change and the at least one correlated problem event. For most, if not all, of the distance measure, the greater the distance measure, the less the change is correlated with each correlated problem event. The distance measure may be a time interval, an activity-weighted interval, or any other type of distance measure.


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